Sparsity-based super-resolved coherent diffraction imaging of one-dimensional objects

TY - JOUR

T1 - Sparsity-based super-resolved coherent diffraction imaging of one-dimensional objects

AU - Sidorenko, Pavel

AU - Kfir, Ofer

AU - Shechtman, Yoav

AU - Fleischer, Avner

AU - Eldar, Yonina C.

AU - Segev, Mordechai

AU - Cohen, Oren

N1 - Publisher Copyright: © 2015 Macmillan Publishers Limited. All rights reserved.

PY - 2015/9/8

Y1 - 2015/9/8

N2 - Phase-retrieval problems of one-dimensional (1D) signals are known to suffer from ambiguity that hampers their recovery from measurements of their Fourier magnitude, even when their support (a region that confines the signal) is known. Here we demonstrate sparsity-based coherent diffraction imaging of 1D objects using extreme-ultraviolet radiation produced from high harmonic generation. Using sparsity as prior information removes the ambiguity in many cases and enhances the resolution beyond the physical limit of the microscope. Our approach may be used in a variety of problems, such as diagnostics of defects in microelectronic chips. Importantly, this is the first demonstration of sparsity-based 1D phase retrieval from actual experiments, hence it paves the way for greatly improving the performance of Fourier-based measurement systems where 1D signals are inherent, such as diagnostics of ultrashort laser pulses, deciphering the complex time-dependent response functions (for example, time-dependent permittivity and permeability) from spectral measurements and vice versa.

AB - Phase-retrieval problems of one-dimensional (1D) signals are known to suffer from ambiguity that hampers their recovery from measurements of their Fourier magnitude, even when their support (a region that confines the signal) is known. Here we demonstrate sparsity-based coherent diffraction imaging of 1D objects using extreme-ultraviolet radiation produced from high harmonic generation. Using sparsity as prior information removes the ambiguity in many cases and enhances the resolution beyond the physical limit of the microscope. Our approach may be used in a variety of problems, such as diagnostics of defects in microelectronic chips. Importantly, this is the first demonstration of sparsity-based 1D phase retrieval from actual experiments, hence it paves the way for greatly improving the performance of Fourier-based measurement systems where 1D signals are inherent, such as diagnostics of ultrashort laser pulses, deciphering the complex time-dependent response functions (for example, time-dependent permittivity and permeability) from spectral measurements and vice versa.

UR - http://www.scopus.com/inward/record.url?scp=84941038723&partnerID=8YFLogxK

U2 - 10.1038/ncomms9209

DO - 10.1038/ncomms9209

M3 - 文章

AN - SCOPUS:84941038723

SN - 2041-1723

VL - 6

JO - Nature Communications

JF - Nature Communications

M1 - 8209

ER -